Atom probe tomography is without peer as a tool enabling the microscopic 3-D mapping of the location and chemistry of elements of the periodic table. The atom probe suite comprises two local electrode atom probes, the most recent acquisition being a laser-based platform that greatly expands the types of materials that can be characterised to include ceramics, semiconductors, organics, glasses, oxide layers, and even biological materials.
Capabilities Cameca/Imago LEAP 3000Si
Advanced atom probe instrument combining high speed acquisition and large field of view. For analysis of conducting and semiconducting materials.
- Acquisition rate up to 107 ions per hour.
- 106 – 3 x 107 atoms per specimen (typ.)
- Analysis volume: 50 x 50 x 100nm (typ.)
- Spacial resolution: 0.5nm
- Mass resolution: 500
Capabilities Cameca/Imago LEAP 4000XSi
The pulsed-laser system allows the 3-D analysis of composition and structure at atomic resolution in non-conductive systems such as ceramics, semiconductors, organics, glasses, oxide layers and even biological materials.