A high-sensitivity platform with sub-micron spatial resolution for characterising the surface chemistry of samples from the environmental, physical and life sciences.
- Mass spectra of surface layers of materials and absorbed molecules.
- Imaging of spatial distributions of mass signals on materials surfaces.
ToF-SIMS imaging of a diagnostic microarray surface.
Part of the mass spectrum recorded with a sub-monolayer antibacterial coating.
Ian Wark Research Institute, University of South Australia
South Australian Regional Facility (SARF)
Dr John Denman, ToF-SIMS Technologist
Tel: 08 8302 5529