PHI TRIFT V nanoToF ToF-SIMS (UniSA)

Time-Of-Flight Secondary Ion Mass Spectrometer

Capabilities

A high-sensitivity platform with sub-micron spatial resolution for characterising the surface chemistry of samples from the environmental, physical and life sciences.

Benefits :

  • Mass spectra of surface layers of materials and absorbed molecules.
  • Imaging of spatial distributions of mass signals on materials surfaces.

Example images

ToF-SIMS imaging of a diagnostic microarray surface.

Part of the mass spectrum recorded with a sub-monolayer antibacterial coating.

Contact

Ian Wark Research Institute, University of South Australia
South Australian Regional Facility (SARF)
Dr John Denman, ToF-SIMS Technologist
Tel: 08 8302 5529
Email: john.denman@unisa.edu.au